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Scanning capacitance microscopy information


Scanning capacitance microscopy (SCM) is a variety of scanning probe microscopy in which a narrow probe electrode is positioned in contact or close proximity of a sample's surface and scanned. SCM characterizes the surface of the sample using information obtained from the change in electrostatic capacitance between the surface and the probe.

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Scanning capacitance microscopy

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Scanning capacitance microscopy (SCM) is a variety of scanning probe microscopy in which a narrow probe electrode is positioned in contact or close proximity...

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Scanning probe microscopy

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force microscopy PTMS, photothermal microspectroscopy/microscopy SCM, scanning capacitance microscopy SGM, scanning gate microscopy SQDM, scanning quantum...

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Scanning microscopy

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microscope Scanning capacitance microscopy Near-field scanning optical microscope This disambiguation page lists articles associated with the title Scanning microscopy...

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Atomic force microscopy

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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated...

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SCM

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Learning and Statistics, a Causal Model. Scanning capacitance microscopy, a mode of scanning probe microscopy Schwarz, Corradi, Melnick, an astronomical...

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Tomography

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technique called synchrotron X-ray tomographic microscopy (SRXTM) allows for detailed three-dimensional scanning of fossils. The construction of third-generation...

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Conductive atomic force microscopy

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to perform other operations, like scanning capacitance microscopy (SCM) or scanning spreading resistance microscopy (SSRM). In most CAFM experiments the...

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Transmission electron microscopy

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Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen...

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List of materials analysis methods

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Confocal laser scanning microscopy COSY – Correlation spectroscopy Cryo-EM – Cryo-electron microscopy Cryo-SEM – Cryo-scanning electron microscopy CV – Cyclic...

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Scanning tunneling spectroscopy

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Scanning tunneling spectroscopy (STS), an extension of scanning tunneling microscopy (STM), is used to provide information about the density of electrons...

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4D scanning transmission electron microscopy

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4D scanning transmission electron microscopy (4D STEM) is a subset of scanning transmission electron microscopy (STEM) which utilizes a pixelated electron...

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Supercapacitor

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also called an ultracapacitor, is a high-capacity capacitor, with a capacitance value much higher than solid-state capacitors but with lower voltage...

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Glossary of nanotechnology

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extraordinarily rapid response. Scanning Capacitance Microscopy A method for mapping the local capacitance of a surface. Scanning Force Microscope (SFM) An...

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Kelvin probe force microscope

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force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). By raster scanning in the...

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Semiconductor characterization techniques

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Cathodoluminescence Electron beam techniques Scanning Electron Microscopy (SEM) Transmission Electron Microscopy (TEM) Auger electron spectroscopy (AES) Electron...

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Electrostatic force microscope

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force microscopy – a scanning probe microscopy technique very similar to EFM, except with emphasis on the measurement of VCPD. Magnetic force microscopy –...

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Nanoprobing

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be scanned to generate high resolution AFM topography images, as well as Conductive AFM, Scanning Capacitance, and Electrostatic Force Microscopy images...

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Lipid bilayer characterization

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micrometre) sheet, which can be difficult and time-consuming. Scanning Electron Microscopy (SEM) does not require this step, but cannot offer the same resolution...

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Nanophotonics

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sharp tips used in near-field scanning optical microscopy (SNOM or NSOM) and photoassisted scanning tunnelling microscopy. Nanophotonics researchers pursue...

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Surface metrology

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Vertical scanning: Coherence scanning interferometry Confocal microscopy Focus variation Confocal chromatic aberration Horizontal scanning: Scanning laser...

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Scanning joule expansion microscopy

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In microscopy, scanning joule expansion microscopy (SJEM) is a form of scanning probe microscopy heavily based on atomic force microscopy (AFM) that maps...

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Photoconductive atomic force microscopy

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electrical scanning probe microscopy (SPM) is an active area of research. Electrostatic force microscopy (EFM) and scanning Kelvin probe microscopy (SKPM)...

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Volta potential

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microscope, based on atomic force microscopy. Over larger areas on the order of millimeters to centimeters, a scanning Kelvin probe (SKP), which uses a...

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Differential Hall Effect Metrology

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development of techniques such as Scanning Spreading Resistance Microscopy (SSRM) and Electrochemical Capacitance-Voltage (E-CV) techniques. Both there...

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List of sensors

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Active pixel sensor Back-illuminated sensor BioFET Biochip Biosensor Capacitance probe Capacitive sensing Catadioptric sensor Carbon paste electrode Digital...

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Nanometrology

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electron microscopy, High Resolution Transmission Electron Microscopy, atomic force microscopy, scanning electron microscopy, field emission scanning electron...

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