This article includes a list of general references, but it lacks sufficient corresponding inline citations. Please help to improve this article by introducing more precise citations.(July 2017) (Learn how and when to remove this message)
NIST Next-Generation Nanometrology research.[1]
Nanometrology is a subfield of metrology, concerned with the science of measurement at the nanoscale level. Nanometrology has a crucial role in order to produce nanomaterials and devices with a high degree of accuracy and reliability in nanomanufacturing.
A challenge in this field is to develop or create new measurement techniques and standards to meet the needs of next-generation advanced manufacturing, which will rely on nanometer scale materials and technologies. The needs for measurement and characterization of new sample structures and characteristics far exceed the capabilities of current measurement science. Anticipated advances in emerging U.S. nanotechnology industries will require revolutionary metrology with higher resolution and accuracy than has previously been envisioned.[1]
^ ab"Programs of the Manufacturing Engineering Laboratory" (PDF). U.S. National Institute of Standards and Technology. March 2008. Archived from the original (PDF) on 2010-04-01. Retrieved 2009-07-04. This article incorporates text from this source, which is in the public domain.
Nanometrology is a subfield of metrology, concerned with the science of measurement at the nanoscale level. Nanometrology has a crucial role in order...
Their measurement requires new approaches in nanometrology. The Laboratory for Emerging Nanometrology and Analytics (LENA) is investigating the limits...
Letters Mathematics and Computer Science Modern Chemistry Nanoscience and Nanometrology Nuclear Science Optics Pathology and Laboratory Medicine Petroleum Science...
Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology (Second ed.). Elsevier. pp. 108–112 ISBN 9780128133477. Weisstein, Eric...
Imperial, completing her PhD in physics in 2016, where her work in nanometrology in organic semiconductors was supervised by Ji-Seon Kim. Wade's research...
Teodor Paweł Gotszalk is a Polish scientist who is head of Department of Nanometrology at Wrocław University of Science and Technology. Corresponding member...
A nanoruler is a tool or a method used within the subfield of "nanometrology" to achieve precise control and measurements at the nanoscale (i.e. nanometer...
Center which was initiated by Park Systems Corporation, a South Korean Nanometrology company. In August 2023, The College of Nanoscale Science and Engineering...
The characterization of nanoparticles is a branch of nanometrology that deals with the characterization, or measurement, of the physical and chemical...
doi:10.1109/IEDM.1982.190285. S2CID 44669969. Gao, Wei (2010). Precision Nanometrology: Sensors and Measuring Systems for Nanomanufacturing. Springer. pp. 15–16...
nanoscale dimensional metrology. The TSOM method is alleged to have several nanometrology applications ranging from nanoparticles to through-silicon-vias (TSV)...
Global Information
This article incorporates text from this source, which is in the public domain.
