This article needs to be updated. Please help update this article to reflect recent events or newly available information.(April 2021)
Scientific experimental technique
Scanning voltage microscopy (SVM), sometimes also called nanopotentiometry, is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or optoelectronic sample. By connecting the probe to a high-impedance voltmeter and rastering over the sample's surface, a map of the electric potential can be acquired. SVM is generally nondestructive to the sample although some damage may occur to the sample or the probe if the pressure required to maintain good electrical contact is too high. If the input impedance of the voltmeter is sufficiently large, the SVM probe should not perturb the operation of the operational sample.[1][2]
^Kalinin, Sergei V.; Gruverman, Alexei (2007-04-03). Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale. Springer Science & Business Media. pp. 562–564. ISBN 978-0-387-28668-6.
^Kuntze, Scott B.; Ban, Dayan; Sargent, Edward H.; Dixon-Warren, St. John; White, J. Kenton; Hinzer, Karin (2007), Kalinin, Sergei; Gruverman, Alexei (eds.), "Scanning Voltage Microscopy", Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale, New York, NY: Springer, pp. 561–600, doi:10.1007/978-0-387-28668-6_21, ISBN 978-0-387-28668-6, retrieved 2021-04-22
and 23 Related for: Scanning voltage microscopy information
Scanningvoltagemicroscopy (SVM), sometimes also called nanopotentiometry, is a scientific experimental technique based on atomic force microscopy. A...
A scanning tunneling microscope (STM) is a type of scanning probe microscope used for imaging surfaces at the atomic level. Its development in 1981 earned...
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated...
Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded...
electron microscopy (EFTEM) High-resolution transmission electron microscopy (HRTEM) Scanning confocal electron microscopy (SCEM) Scanning electron microscope...
Scanning tunneling spectroscopy (STS), an extension of scanning tunneling microscopy (STM), is used to provide information about the density of electrons...
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons...
Transmission electron microscopy (TEM) where swift electrons go through a thin sample Scanning transmission electron microscopy (STEM) which is similar...
Scanning electrochemical microscopy (SECM) is a technique within the broader class of scanning probe microscopy (SPM) that is used to measure the local...
force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). By raster scanning in the...
transmission electron microscopy (HRTEM) Low-voltage electron microscope (LVEM) Precession electron diffraction Scanning confocal electron microscopy "Viruses"....
In condensed matter physics, scanning SQUID microscopy is a technique where a superconducting quantum interference device (SQUID) is used to image surface...
party in Serbia Sanjay Vichar Manch, a political party in India Scanningvoltagemicroscopy Secure Virtual Machine, a virtualization technology by AMD Shared...
force microscopy – a scanning probe microscopy technique very similar to EFM, except with emphasis on the measurement of VCPD. Magnetic force microscopy –...
Scanning capacitance microscopy (SCM) is a variety of scanning probe microscopy in which a narrow probe electrode is positioned in contact or close proximity...
Scanning electron cryomicroscopy (CryoSEM) is a form of electron microscopy where a hydrated but cryogenically fixed sample is imaged on a scanning electron...
Piezoresponse force microscopy (PFM) is a variant of atomic force microscopy (AFM) that allows imaging and manipulation of piezoelectric/ferroelectric...
The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs...
The electrochemical scanning tunneling microscope (EC-STM) is a scanning tunneling microscope that measures the structures of surfaces and electrochemical...
photoelectron spectroscopy (PES), transmission electron microscopy (TEM), and scanning electron microscopy (SEM). In 1933, Ernst Brüche reported images of cathodes...
Magnetic force microscopy (MFM) is a variety of atomic force microscopy, in which a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic...
Industrial CT scanning has been utilized in many areas of industry for internal inspection of components. Some of the key uses for CT scanning have been flaw...
Global Information