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Probe tip information


A probe tip is an instrument used in scanning probe microscopes (SPMs) to scan the surface of a sample and make nano-scale images of surfaces and structures. The probe tip is mounted on the end of a cantilever and can be as sharp as a single atom. In microscopy, probe tip geometry (length, width, shape, aspect ratio, and tip apex radius) and the composition (material properties) of both the tip and the surface being probed directly affect resolution and imaging quality. Tip size and shape are extremely important in monitoring and detecting interactions between surfaces. SPMs can precisely measure electrostatic forces, magnetic forces, chemical bonding, Van der Waals forces, and capillary forces. SPMs can also reveal the morphology and topography of a surface.

The use of probe-based tools began with the invention of scanning tunneling microscopy (STM) and atomic force microscopy (AFM), collectively called scanning probe microscopy (SPM) by Gerd Binnig and Heinrich Rohrer at the IBM Zurich research laboratory in 1982. It opened a new era for probing the nano-scale world of individual atoms and molecules as well as studying surface science, due to their unprecedented capability to characterize the mechanical, chemical, magnetic, and optical functionalities of various samples at nanometer-scale resolution in a vacuum, ambient, or fluid environment.

The increasing demand for sub-nanometer probe tips is attributable to their robustness and versatility. Applications of sub-nanometer probe tips exist in the fields of nanolithography, nanoelectronics, biosensor, electrochemistry, semiconductor, micromachining and biological studies.

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Probe tip

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A probe tip is an instrument used in scanning probe microscopes (SPMs) to scan the surface of a sample and make nano-scale images of surfaces and structures...

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Scanning probe microscopy

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microscopy * SRPM, scanning resistive probe microscopy To form images, scanning probe microscopes raster scan the tip over the surface. At discrete points...

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Atomic force microscopy

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position of the sample with respect to the tip and recording the height of the probe that corresponds to a constant probe-sample interaction (see § Topographic...

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Test probe

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probe body, the wire is connected to a rigid, pointed metal tip that contacts the DUT. Some probes allow an alligator clip to be attached to the tip,...

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Probe card

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between the probe card and wafer. Once the probe card and the wafer are loaded, a camera in the prober will optically locate several tips on the probe card and...

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Periodontal probe

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markings written on it. Proper use of the periodontal probe is necessary to maintain accuracy. The tip of the instrument is placed with light pressure of...

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Maskless lithography

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repair. Also, systems based on arrays of mechanical and thermally ablative probe tips have been demonstrated. The most commonly used form of maskless lithography...

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Mechanical probe station

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mechanical probes: active and passive. Passive probes usually consist of a thin tungsten needle. Active probes utilize a FET device on the probe tip in order...

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Voltage divider

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frequency response over a wide range is required (such as in an oscilloscope probe), a voltage divider may have capacitive elements added to compensate load...

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Oscilloscope

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different points every repetition, until the probe tip is in contact. Until then, a tiny arc charges the probe tip, and its capacitance holds the voltage (open...

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Photon scanning microscopy

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tunneling of photons instead of electrons from the sample surface to the probe tip. A beam of light is focused on a prism at an angle greater than the critical...

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Electrology

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about 0–8 watts at a frequency of 13.56 MHz. RF energy emanates from the probe tip to tissue within about a millimeter. Thermolysis works by heating the...

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Aerial refueling

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converted B-29s using the drogue-and-probe in-flight refueling system with the probe located in one of the F-84's wing-tip fuel tanks. The flying boom is a...

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Atom probe

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the tip but even at 78 Kelvin atomic resolution is achieved. The 10-cm Atom Probe, invented in 1973 by J. A. Panitz was a “new and simple atom probe which...

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Langmuir probe

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the tips and larger than the probe radius, and 3.) the probe sheath sizes are much smaller than the probe separation, then the current to any probe can...

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Piezoresponse force microscopy

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conductive probe into contact with a ferroelectric surface (or piezoelectric material) and applying an alternating current (AC) bias to the probe tip in order...

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Millipede memory

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erasing it (see also: thermo-mechanical scanning probe lithography). After writing, the probe tip can be used to read the indentations. If each indentation...

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Picotechnology

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For example, the force between an atom in an atomic force microscope probe tip and an atom in a sample being studied vary exponentially with separation...

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Oxygen sensor

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where lambda refers to air–fuel equivalence ratio, usually denoted by λ) or probe or sond, is an electronic device that measures the proportion of oxygen...

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SICM

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Scanning ion-conductance microscopy, a scanning probe microscopy technique that uses an electrode as the probe tip Society of Intensive Care Medicine, Singapore-based...

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Kelvin probe force microscope

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gate a tip-attached quantum dot. The quality of an SKP measurement is affected by a number of factors. This includes the diameter of the SKP probe, the...

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Campanile probe

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the probe tip, the metal-coated facets are separated by a gap of a few tens of nanometers, which determines the spatial resolution of the probe. Such...

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Spreading resistance profiling

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tungsten carbide probe tips placed about 20 um apart. Each tip is mounted on a kinematic bearing to minimize "scrubbing" (where the probes scratch along...

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Chemical force microscopy

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morphology is probed using simple tapping or contact modes that utilize van der Waals interactions between tip and sample to maintain a constant probe deflection...

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Coulombmeter

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a coulombmeter consists of a meter used in combination with a metal probe tip to pinpoint locations of excess charge on, for instance a semiconductor...

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Thermal scanning probe lithography

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(atomic force microscope) probes for the modification of surfaces. In 1992, they used microsecond laser pulses to heat AFM tips to write indents as small...

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Tympanometry

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build up in the middle ear cavity. A tone of 226 Hz is generated by a probe tip inserted into the external ear canal, where the sound strikes the tympanic...

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