This article includes a list of references, related reading, or external links, but its sources remain unclear because it lacks inline citations. Please help improve this article by introducing more precise citations.(January 2015) (Learn how and when to remove this message)
In situ electron microscopy is an investigatory technique where an electron microscope is used to watch a sample's response to a stimulus in real time. Due to the nature of the high-energy beam of electrons used to image a sample in an electron microscope, microscopists have long observed that specimens are routinely changed or damaged by the electron beam. Starting in the 1960s, and using transmission electron microscopes (TEMs), scientists made deliberate attempts to modify materials while the sample was in the specimen chamber, and to capture images through time of the induced damages.
Also in the 1960s, materials scientists using TEMs began to study the response of electron-transparent metal samples to irradiation by the electron beam. This was in order to understand more about metal fatigue during aviation and space flight. The experiments were performed on instruments with high accelerating voltages; the image resolution was low compared to the sub-nanometer resolution available with modern TEMs.
Improvements in electron microscopy from the 1960s onwards focused on increasing the spatial resolution. This required increased stability for the entire imaging platform, but particularly for the area around the specimen stage. Improved image-capture systems using charge-coupled device cameras and advances in specimen stages coupled with the higher resolution led to creating systems devoted to applying stimuli to samples in specialized holders, and capturing multiple frames or videos of the samples' responses.
In addition to materials samples, in situ electron microscopy is performed on biological specimens, and is used to conduct experiments involving mechanical, chemical, thermal, and electrical responses. Early experiments mostly used TEMs, because the image is captured in a single frame, whereas the scanning electron microscope must move or scan across the sample while the stimuli is being applied, altering the sample.
Early problems that limited in situ electron microscopy included mechanical vibration at all scales (from the microscope itself to the sample), and thermal and electrical interference, particularly at the specimen holder. These problems all required fast capture times. However a fast capture time creates an image with a low signal-to-noise ratio, limits the resolution of the image, and also limits the amount of time available for conducting the experiment.[1]
^Banhart, editor, Florian (2008). In-Situ Electron Microscopy At High Resolution. Singapore: World Scientific. ISBN 978-9812797339. {{cite book}}: |first1= has generic name (help)CS1 maint: multiple names: authors list (link)
and 26 Related for: In situ electron microscopy information
Transmission electronmicroscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen...
microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy.[citation needed] Optical microscopy and...
biological samples, however, is to freeze them (cryo-electronmicroscopy or cryoEM). As in other electron cryomicroscopy techniques, samples for cryoET (typically...
Photoemission electronmicroscopy (PEEM, also called photoelectron microscopy, PEM) is a type of electronmicroscopy that utilizes local variations inelectron emission...
Electron backscatter diffraction (EBSD) is a scanning electronmicroscopy (SEM) technique used to study the crystallographic structure of materials. EBSD...
developing the advanced insituelectronmicroscopy techniques. She is a Fellow of the Materials Research Society. Zheng was born in China. She was an undergraduate...
light and electron microscopes, whole mount insitu hybridization, double detection of RNAs and RNA plus protein, and fluorescent insitu hybridization...
micro-scale cold welding process). High-resolution transmission electronmicroscopy and insitu measurements reveal that the welds are nearly perfect, with...
showing the affected areas in red. Correlative light-electronmicroscopy Elizabeth Harry, pioneer of fluorescence microscopy techniques for visualization...
optical microscopy and electronmicroscopy is that AFM does not use lenses or beam irradiation. Therefore, it does not suffer from a limitation in spatial...
Confocal microscopy, most frequently confocal laser scanning microscopy (CLSM) or laser scanning confocal microscopy (LSCM), is an optical imaging technique...
milling can be used for thinning specimens until electron transparency in transmission electronmicroscopy (TEM). The accurate and damage-free surface ion...
in 1974 for research on weak beam electronmicroscopy conducted in the Cavendish Laboratory. Gai has pioneered advanced in-situelectronmicroscopy applications...
fixative for light microscopy is 10% neutral buffered formalin, or NBF (4% formaldehyde in phosphate buffered saline). For electronmicroscopy, the most commonly...
insitu, i.e., testing while observing the evolution of the sample in high magnification instruments such as optical microscopes, scanning electron microscopes...
Integrated Dynamic Electron Solutions,http://www.ides-inc.com/ "JEOL CANADA Names SOQUELEC as Microscopy Sales Representative in Canada". April 1, 2021...
production of hormones in pituitary adenoma cell cultures via light microscopy and other electron microscopic methods. This type of microscopy confirmed that...
Transmission electron cryomicroscopy (CryoTEM), commonly known as cryo-EM, is a form of cryogenic electronmicroscopy, more specifically a type of transmission...
Global Information