Vibrational analysis with scanning probe microscopy information
The technique of vibrational analysis with scanning probe microscopy allows probing vibrational properties of materials at the submicrometer scale, and even of individual molecules.[1][2][3] This is accomplished by integrating scanning probe microscopy (SPM) and vibrational spectroscopy (Raman scattering or/and Fourier transform infrared spectroscopy, FTIR). This combination allows for much higher spatial resolution than can be achieved with conventional Raman/FTIR instrumentation. The technique is also nondestructive, requires non-extensive sample preparation, and provides more contrast such as intensity contrast, polarization contrast and wavelength contrast, as well as providing specific chemical information and topography images simultaneously.
^Dragnea, Bogdan; Leone, Stephen (2001). "Advances in submicron infrared vibrational band chemical imaging". International Reviews in Physical Chemistry. 20 (1): 59–92. Bibcode:2001IRPC...20...59D. doi:10.1080/01442350010012557. S2CID 9166775.
^Vobornik, Dušan (2005). Scanning near-field infrared microscopy and spectromicroscopy applied to nano-systems and cells (Thesis). doi:10.5075/epfl-thesis-3296. Retrieved 15 July 2013.
^Boerio, F. J.; Starr, M. J. (2008). "AFM/FTIR: A New Technique for Materials Characterization". The Journal of Adhesion. 84 (10): 872–895. doi:10.1080/00218460802445308. S2CID 85439894.
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