The Journal of Applied Crystallography is a peer-reviewed scientific journal published by Wiley-Blackwell on behalf of the International Union of Crystallography. It was established in 1968 with André Guinier as the founding editor.[1] The journal covers the application of crystallography and crystallographic techniques.[2] William Parrish (1914–1991) chaired the committee that started the journal.[3]
The Journal of Applied Crystallography publishes articles on the crystallographic methods that are used to study crystalline and non-crystalline matter with neutrons, X-rays and electrons, their application in condensed matter research, materials science and the life sciences, and their use in identifying phase transformations and structural changes of defects, structure-property relationships, interfaces and surfaces etc. The journal also covers developments in crystallographic instrumentation and apparatus, theory and interpretation and numerical analysis and other related subjects, together with information on crystallographic computer programs.[4]
^Allen, Andrew J.; Hajdu, Janos; McIntyre, Garry J. (2018-04-01). "Journal of Applied Crystallography : the first 50 years and beyond". Journal of Applied Crystallography. 51 (2): 233–234. doi:10.1107/S1600576718004478. ISSN 1600-5767.
^Kostorz, G. (2000). "A new format and overall appearance for Journal of Applied Crystallography". Journal of Applied Crystallography. 33: 1. doi:10.1107/S0021889800000200.
^Castro, George (1992). "Obituary. William Parrish". Physics Today. 45 (5): 77. doi:10.1063/1.2809674.
^"Journal of Applied Crystallography".
and 18 Related for: Journal of Applied Crystallography information
The JournalofAppliedCrystallography is a peer-reviewed scientific journal published by Wiley-Blackwell on behalf of the International Union of Crystallography...
journals form part of the journal portfolio of the IUCr, which is completed by the JournalofAppliedCrystallography, the Journalof Synchrotron Radiation...
1997). "The Use of the Pseudo-Voigt Function in the Variance Method of X-ray Line-Broadening Analysis". JournalofAppliedCrystallography. 30 (4): 427–430...
timeline ofcrystallography. 1669 - In his book De solido intra solidum naturaliter contento Nicolas Steno asserted that, although the number and size of crystal...
Crystallographica journal series, as well as JournalofAppliedCrystallography, Journalof Synchrotron Radiation, IUCrJ, the series of reference volumes...
(1977). "A new method for the evaluation of small-angle scattering data". JournalofAppliedCrystallography. 10 (5): 415–421. doi:10.1107/s0021889877013879...
"Prediction of potential pseudo-symmetry issues in the indexing of electron backscatter diffraction patterns". JournalofAppliedCrystallography. 52 (5):...
features, more tools, more CrysTBox". JournalofAppliedCrystallography. 50 (4). International Union ofCrystallography (IUCr): 1226–1234. Bibcode:2017JApCr...
free of charge and changed as desired. Kratzert, Daniel; Krossing, Ingo (3 May 2018). "Recent improvements in DSR". JournalofAppliedCrystallography. 51...
modifications of well known techniques for reliable growth of high-quality crystals of small bioorganic molecules". JournalofAppliedCrystallography. 47 (4):...
data for the aluminate sodalite Ca 8[Al 12O 24](WO 4) 2". JournalofAppliedCrystallography. doi:10.1107/S0021889879013492. Pokropivny, Alex; Volz, Sebastian...
nuclear and magnetic structures". JournalofAppliedCrystallography. 2 (2). International Union ofCrystallography (IUCr): 65–71. doi:10.1107/s0021889869006558...
Investigations of CaF2 at High Pressure, L. Gerward, J. S. Olsen, S. Steenstrup, M. Malinowski, S. Åsbrink and A. Waskowska, JournalofAppliedCrystallography (1992)...
tool for studying thin film growth". JournalofAppliedCrystallography. 22 (6). International Union ofCrystallography (IUCr): 528–532. doi:10.1107/s002188988900717x...
"Sucrose, a convenient test crystal for absolute structures". JournalofAppliedCrystallography. 24 (4): 352. Bibcode:1991JApCr..24..352H. doi:10.1107/S0021889891002492...
Global Information
