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Hemispherical electron energy analyzer information


Hemispherical electron energy analyzer
Hemispherical electron energy analyzer.

A hemispherical electron energy analyzer or hemispherical deflection analyzer is a type of electron energy spectrometer generally used for applications where high energy resolution is needed—different varieties of electron spectroscopy such as angle-resolved photoemission spectroscopy (ARPES), X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES)[1] or in imaging applications such as photoemission electron microscopy (PEEM) and low-energy electron microscopy (LEEM).[2]

It consists of two concentric conductive hemispheres that serve as electrodes that bend the trajectories of the electrons entering a narrow slit at one end so that their final radii depend on their kinetic energy. The analyzer, therefore, provides a mapping from kinetic energies to positions on a detector.

  1. ^ Roy, D.; Tremblay, D. (1990). "Design of electron spectrometers". Reports on Progress in Physics. 53 (12): 1621–1674. Bibcode:1990RPPh...53.1621R. doi:10.1088/0034-4885/53/12/003. ISSN 0034-4885. S2CID 250872079.
  2. ^ Tusche, Christian; Chen, Ying-Jiun; Schneider, Claus M.; Kirschner, Jürgen (2019-11-01). "Imaging properties of hemispherical electrostatic energy analyzers for high resolution momentum microscopy". Ultramicroscopy. 206: 112815. doi:10.1016/j.ultramic.2019.112815. ISSN 0304-3991. PMID 31325896.

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