Global InformationCentre for Device Thermography and Reliability information
| Established | 2001 |
|---|---|
Academic affiliations | University of Bristol |
| Endowment | £2.6m[1](2012-13) |
| Director | Martin Kuball |
| Deputy Director | Michael Uren |
Academic staff | 18 |
Administrative staff | 3 |
| Location | Bristol , England 51°27′23″N 02°36′16″W / 51.45639°N 2.60444°W |
| Website | www |
The Centre for Device Thermography and Reliability is a research facility at the University of Bristol, a research university located in Bristol, United Kingdom.[2] Founded in 2001, by Professor Kuball the centre is engaged in thermal and reliability research of semiconductor devices, in particular for microwave and power electronic devices. It is housed in the H. H. Wills Physics Laboratory, a noted physics laboratory associated with the Physics department of the university.[3] The centre is noted for developing an integrated Raman-IR thermography technique to probe self-heating in silicon, GaAs and other devices. This enables unique thermal analysis of semiconductor devices on a detailed level not possible before.[4] These techniques are critical in understanding the reliability of Compound semiconductor devices applicable in power and microwave devices and in the long term as a viable replacement for Silicon devices as it approaches the end of scaling.[5]
The institute gets funding from various government and private sector sources, such as European Space Agency and Engineering and Physical Sciences Research Council.[6]
- ^ "Annual report and financial statements 2012/13" (PDF). University of Bristol. Archived from the original (PDF) on 12 January 2014. Retrieved 10 September 2014.
- ^ "Maps and Guides". The University precinct map. Retrieved 10 September 2014.
- ^ "The University of Bristol". Worldwide Universities Network. Archived from the original on 11 September 2014. Retrieved 10 September 2014.
- ^ Sarua, A (7 July 2008). "Raman-IR micro-thermography tool for reliability and failure analysis of electronic devices". 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits. Proc. Physical and Failure Analysis of Integrated Circuits, 2008. pp. 1–5. doi:10.1109/IPFA.2008.4588160. ISBN 978-1-4244-2039-1. S2CID 2890666.
- ^ Handy, Jim (13 November 2011). "The End of Semiconductor Scaling". Forbes. Retrieved 16 September 2014.
- ^ "Funding". School of Physics | University of Bristol. Archived from the original on 21 September 2020.