Excitation and detection scheme in bimodal AFM. The cantilever is excited at its first two eigenmodes with frequencies and . Upon interaction with the sample, the components of the tip's response are processed. The topography is obtained by keeping = constant. In a bimodal AM-FM configuration, two feedback loops act on the 2nd mode. One keeps fixed while a phase-lock loop keeps .
Bimodal Atomic Force Microscopy (bimodal AFM) is an advanced atomic force microscopy technique characterized by generating high-spatial resolution maps of material properties. Topography, deformation, elastic modulus, viscosity coefficient or magnetic field maps might be generated. Bimodal AFM is based on the simultaneous excitation and detection of two eigenmodes (resonances) of a force microscope microcantilever.
and 5 Related for: Bimodal atomic force microscopy information
Atomicforcemicroscopy (AFM) or scanning forcemicroscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution...
the qPlus sensor, a new probe for atomicforcemicroscopy and continued experimental and theoretical work on the force microscope at the chair of Professor...
sintering. This phenomenon, known as abnormal grain growth (AGG), results in a bimodal grain size distribution that has consequences for the mechanical, dielectric...
X. Y.; Yue, Y. L.; Zhang, L.; Zhi, Q. J.; Zhu, Y. (October 2021). "A bimodal burst energy distribution of a repeating fast radio burst source". Nature...
Global Information
